《Microscopy And Microanalysis》雜志的最新年發(fā)文量為184篇。
這表明該刊在每年都會精選并發(fā)表一定數(shù)量的高質(zhì)量文章,以保持其在材料科學(xué):綜合領(lǐng)域的學(xué)術(shù)影響力。
該刊聚焦于工程技術(shù)-材料科學(xué):綜合領(lǐng)域的前沿研究,致力于推動該領(lǐng)域新技術(shù)和新知識的傳播與應(yīng)用。同時它積極鼓勵研究人員詳細(xì)發(fā)表其高質(zhì)量的實驗研究和理論成果。
該刊的平均審稿周期約為 一般,3-6周 。
Microscopy And Microanalysis 雜志發(fā)文統(tǒng)計
文章名稱引用次數(shù)
- Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond39
- High Throughput Quantitative Metallography for Complex Microstructures Using Deep Learning: A Case Study in Ultrahigh Carbon Steel18
- Identification of Medicinally Used Flora Using Pollen Features Imaged in the Scanning Electron Microscopy in the Lower Margalla Hills Islamabad Pakistan13
- Extracting Grain Orientations from EBSD Patterns of Polycrystalline Materials Using Convolutional Neural Networks10
- Fabrication of Atom Probe Tomography Specimens from Nanoparticles Using a Fusible Bi-In-Sn Alloy as an Embedding Medium8
- Atom Probe Tomography Interlaboratory Study on Clustering Analysis in Experimental Data Using the Maximum Separation Distance Approach7
- Quantification Challenges for Atom Probe Tomography of Hydrogen and Deuterium in Zircaloy-47
- Evaluation and Microanalysis of Parasitic and Bacterial Agents of Egyptian Fresh Sushi, Salmo salar7
- Description of Ore Particles from X-Ray Microtomography (XMT) Images, Supported by Scanning Electron Microscope (SEM)-Based Image Analysis7
- An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography6
國家/地區(qū)發(fā)文量
- USA94
- CHINA MAINLAND48
- GERMANY (FED REP GER)43
- England29
- India25
- Australia22
- Egypt21
- France16
- Japan16
- Netherlands16